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GADEST 2026

27 September 2026 to 2 October 2026
GADEST 2026 - San Servolo Island, Venice (Italy)
Europe/Rome timezone

Session

Poster Session - 1

PS-1
28 Sept 2026, 19:00
GADEST 2026 - San Servolo Island, Venice (Italy)

GADEST 2026 - San Servolo Island, Venice (Italy)

Presentation materials

There are no materials yet.

  1. 9. Admittance spectroscopy of organic-silicon heterojunction structures fabricated with ultrasound assistance
    Prof. Oleg Olikh (Taras Shevchenko National University of Kyiv)
    28/09/2026, 19:00
    Poster presentation
  2. 34. Comparative study of void defect annihilation in Si (100) and Si (110) wafers during high-temperature rapid thermal processing
    Mr Takuya Kusunoki (Graduate School of Computer Science and Systems Engineering, Okayama Prefectural University, Technology Group, Technology Department, GlobalWafers Japan Co., Ltd)
    28/09/2026, 19:00
    Poster presentation
  3. 22. Controlled Copper Precipitation for Rapid Point Defect Characterization in Near-Perfect Czochralski Silicon
    Shuai Yuan (Zhejiang University)
    28/09/2026, 19:00
    Poster presentation
  4. 14. DFT Analysis of Gettering in Si Wafers for CMOS Image Sensors
    Dr Iori Takeda (Okayama Prefectural University)
    28/09/2026, 19:00
    Poster presentation
  5. 28. Doping Engineering of Double-SOI Structures for Two-Channel Tunneling Transistors
    Dr Shengqiang Zhou (Helmholtz-Zentrum Dresden-Rossendorf)
    28/09/2026, 19:00
    Poster presentation
  6. 102. Electric Field Distribution in Black Silicon Needles Under Reverse Bias: A TCAD Simulation Study
    Oskari Leiviskä (Aalto University)
    28/09/2026, 19:00
    Poster presentation
  7. 15. Electrical and Optical Properties of Defect-Enhanced SiGe Heterostructures
    kaynat alvi (Tyndall National Institute, Munster Technological University, Cork, Ireland)
    28/09/2026, 19:00
    Poster presentation
  8. 143. Electrical Properties of Dislocation-Related Defects in Ge/Si Virtual Substrates
    Henriette Tetzner
    28/09/2026, 19:00
    Poster presentation
  9. 87. Electrically detected magnetic resonance of telecom-wavelength G and C centers in silicon
    Alessandro Puddu (Helmholtz-Zentrum Dresden-Rossendorf / Technische Universität Dresden)
    28/09/2026, 19:00
    Poster presentation
  10. 37. Elimination of slip lines induced by the pins in rapid thermal processing for Czochralski silicon wafers
    Yilun Wang (Zhejiang University)
    28/09/2026, 19:00
    Poster presentation
  11. 118. Elusive point radiation defects in proton-irradiated silicon and germanium
    Dr Nikolay Arutyunov
    28/09/2026, 19:00
    Poster presentation
  12. 76. Engineering Nanostructured Electrodes on Screen-Printed Carbon for Real-Time Monitoring of Nitrogen-Based Water Pollutants
    Dr Roberta Farina (CNR IMM sede principale)
    28/09/2026, 19:00
    Poster presentation
  13. 78. Epi stacking fault defects in highly doped phosphorus 300 mm crystals
    Matteo Pannocchia (MEMC GlobalWafers)
    28/09/2026, 19:00
    Poster presentation
  14. 67. Evaluation of impurity effects in magic-angle twisted bilayer graphene by machine learning interatomic potentials
    Ignazio Vacante (CNR-IMM)
    28/09/2026, 19:00
    Poster presentation
  15. 43. Experimental and simulated investigation of nitrogen shallow donors in Czochralski silicon wafers doped with nitrogen
    Dr Dawid Kot
    28/09/2026, 19:00
    Poster presentation
  16. 16. Experimental observation and analysis of gliding I3 basal stacking faults in hexagonal germanium
    Mette Schouten (Eindhoven University of Technology)
    28/09/2026, 19:00
    Poster presentation
  17. 82. Ge-on-Si Substrates with Porous Silicon buffer as Compliant Layer
    Dr Charlotte Weiss (Fraunhofer Institute for Solar Energy Systems (ISE), Heidenhofstraße 2, 79110 Freiburg, Germany)
    28/09/2026, 19:00
    Poster presentation
  18. 38. Impact of Substrate Carbon Impurities on MOSFET Breakdown Voltage via Enhanced Phosphorus Out-Diffusion in n/n⁺ Epitaxial Wafers
    Jinge Wang
    28/09/2026, 19:00
    Poster presentation
  19. 20. Infrared properties of a perfectly compensated germanium doped with shallow donors and acceptors below the Mott transition
    Dr Sergey Pavlov (German Aerospace Center)
    28/09/2026, 19:00
    Poster presentation
  20. 98. Mechanism of slip line propagation in advanced 300mm silicon substrates
    Dr Alexandra Abbadie (STMicroelectronics)
    28/09/2026, 19:00
    Poster presentation
  21. 74. On the formation of local molten regions on Si surfaces by pulsed laser annealing at the melting threshold
    Dr SEBASTIEN KERDILES (Université Grenoble-Alpes, CEA-LETI, France)
    28/09/2026, 19:00
    Poster presentation
  22. 35. On the gettering properties of isovalent tin and lead impurities in n-type Czochralski silicon
    Dr Mykola Kras’ko (Institute of Physics of the NAS of Ukraine)
    28/09/2026, 19:00
    Poster presentation
  23. 36. Optically detected spin properties of the telecom L-band C center in silicon
    Shuyu Wen (Helmholtz-Zentrum Dresden-Rossendorf)
    28/09/2026, 19:00
    Poster presentation
  24. 51. Origin of optically active Er3+ sites in Silicon on Insulator-based photonic waveguides
    Yanan Xu
    28/09/2026, 19:00
    Poster presentation
  25. 71. Progress in understanding optically detected magnetic resonance (ODMR) spectra of ASi-Sii-defects
    Kevin Lauer (CiS Forschungsinstitut für Mikrosensorik)
    28/09/2026, 19:00
    Poster presentation
  26. 83. Pulsed Laser Melting for TOPCon technology: new routes to higher efficiency
    Francesco Sgarbossa (Dfa unipd)
    28/09/2026, 19:00
    Poster presentation
  27. 94. Radiation-induced defect reactions in Silicon Junction Barrier Schottky Diodes upon irradiation with alpha particles in different regimes
    Dr Vladimir Markevich (The University of Manchester)
    28/09/2026, 19:00
    Poster presentation
  28. 5. Search for stable atomic configurations in SiGe, SiSn, and GeSn alloys using DFT and optimization algorithms
    Koji Sueoka
    28/09/2026, 19:00
    Group IV Semiconductors - II
    Poster presentation
  29. 111. Structure loss during the Czochralski silicon process: causes, remedies and ML aid
    Marisa Di Sabatino (NTNU)
    28/09/2026, 19:00
    Poster presentation
  30. 80. Superacid-based diagnosis of damage in high-carrier-lifetime crystalline silicon
    Sophie Pain (University of Birmingham)
    28/09/2026, 19:00
    Group IV Semiconductors - V
    Poster presentation
  31. 127. Surface passivation of silicon by ZnO/Al2O3 stacks with controlled SiOx interlayers
    John Murphy (University of Birmingham)
    28/09/2026, 19:00
    Poster presentation
  32. 13. Theoretical study on the stability of Sn atom in Ge thin film grown on GaSb substrates
    Dr Koji Ozawa (Graduate School of Computer Science and Systems Engineering, Okayama Prefectural University)
    28/09/2026, 19:00
    Poster presentation
  33. 136. Unlocking high throughput material discovery on defective interfaces
    Dr Artem Musiienko (Helmholtz Zentrum Berlin)
    28/09/2026, 19:00
    Poster presentation