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GADEST 2026

27 September 2026 to 2 October 2026
GADEST 2026 - San Servolo Island, Venice (Italy)
Europe/Rome timezone

DFT Analysis of Gettering in Si Wafers for CMOS Image Sensors

28 Sept 2026, 19:00
3h
Grecale Hall E

Grecale Hall E
Poster presentation Poster Session - 1

Speaker

Dr Iori Takeda (Okayama Prefectural University)

Author

Dr Iori Takeda (Okayama Prefectural University)

Co-authors

Dr Hibiki Bekku (Okayama Prefectural University) Dr Hiroya Iwashiro (Okayama Prefectural University) Dr Koji Ozawa (Okayama Prefectural University) Dr Koji Sueoka (Okayama Prefectural University) Dr Yuji Hamamoto (Okayama Prefectural University)

Presentation materials

There are no materials yet.