Author in the following contributions
- Elimination of slip lines induced by the pins in rapid thermal processing for Czochralski silicon wafers
- Impact of Substrate Carbon Impurities on MOSFET Breakdown Voltage via Enhanced Phosphorus Out-Diffusion in n/n⁺ Epitaxial Wafers
- Atomic-scale mechanism of step-edge-induced stacking fault evolution during HVPE growth of (100) β-Ga2O3