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19:00
Detection of nuclei for oxidation induced stacking faults
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Kaisla Sutinen
(Aalto University, Department of Electronics and Nanoengineering)
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19:00
Elaboration of 200 mm GeSnOI via Bonded Etch-Back SOI process
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Jeremie Chretien
(CEA-Leti, Univ. Grenoble Alpes, F-38000 Grenoble, France)
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19:00
Synthesis of supersaturated GeSn alloys on Ge and Ge-on-Si by sputter deposition and nanosecond pulsed laser melting
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Enrico Di Russo
(Università di Padova)
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19:00
Defect Engineering and Passivation at Halide Perovskite and Kesterite Nanoparticles Interface: A Combined Experimental and DFT Study
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Vanira Trifiletti
(University of Milano-Bicocca)
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19:00
Optical Characterisation of Colour Centres in Nitride Layers
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Amy Albrecht
(Technische Universität Bergakademie Freiberg)
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19:00
Defect Suppression in Boron-Doped MW-PECVD-Grown (113)-Oriented Diamond Substrates for Vertical Power Schottky Diodes
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Pavel Hazdra
(Czech Technical University in Prague, Dept. Microelectronics)
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19:00
Oxygen diffusion in Aluminium-Nitride
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Bracht
Tröger-Neuhaus
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19:00
Defect studies and down conversion strategies of double-cation mixed perovskite solar cells
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Corrado Del Conte
(Department of Physics and Astronomy – Alma Mater Studiorum University of Bologna, Viale Berti-Pichat 6/2, Bologna 40127, Italy)
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19:00
Multiparametric Control of MAPbI₃ Growth via Low-Vacuum Proximity-Space Effusion
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Valentina Arena
(CNR-IMM)
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19:00
Photo-elastic Characterization of InP Wafers
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Martin Herms
(PVA Metrology & Plasma Solutions GmbH)
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19:00
Synthesis of artificial graphene in the AlGaN/GaN heterostructure through block copolymer self-assembly
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Anita Patelli
(Università del Piemonte Orientale)
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19:00
Towards Scalable Flexible Kesterite-based solar cells: Addressing Bulk and Interface Defects through Drop-on-Demand Inkjet Printing
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Simona Binetti
(Università degli Studi di Milano-Bicocca)
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19:00
Response Surface Modelling for a Vertical GaN HVPE Reactor within a Constrained Design Space
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Jiri Tomkovic
(Institute of Applied Physics, TU Bergakademie Freiberg)
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19:00
Non-destructive light scattering-based bulk micro defect detection in silicon wafers
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Tamás Szarvas
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19:00
Ab Initio Modeling of Surface-Induced Effects on Quantum Gate Fidelity in 3C-SiC Divacancy Qubits
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Ioannis Deretzis
(Consiglio Nazionale delle Ricerche- Istituto per la Microelettronica e Microsistemi)
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19:00
Strain-controlled directness and confinement margins in CGeSn/(Si)GeSn MQW emitters on (001) Ge/Si
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Walid Belaid
(School of Electronic and Electrical Engineering, University of Leeds, LS2 9JT Leeds, United Kingdom)
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19:00
Novel method to measure the temperature-dependent minority carrier lifetime of crystalline silicon wafers for solar cell applications
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Marisa Di Sabatino
(NTNU)
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19:00
Study of Defect Physics in Zirconia MIM Capacitors
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Nishant Saini
-
19:00
Monolithic GeSn Photodetectors Integrated on Silicon for Mid-Infrared Applications
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Vincent Reboud
(CEA LETI)
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19:00
Impact of Ionic Defects on Mesoporous Perovskite Solar Cells and X-Ray Detectors
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Gaetano Calogero
(CNR-IMM, Catania, Italy)
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19:00
Estimating recombination-active defect concentrations in silicon n+–p–p+ structures via transfer learning from computer vision models
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Oleg Olikh
(Taras Shevchenko National University of Kyiv)
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19:00
Magnetron-Sputtered HfO2 Thin Films for Microelectronic and Sensor Applications
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Vl. Kolkovsky
-
19:00
Atomic-scale mechanism of step-edge-induced stacking fault evolution during HVPE growth of (100) β-Ga2O3
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Haohan Ye
(Zhejiang University)
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19:00
Photoluminescence spectroscopy study on hydride vapour phase epitaxy grown GaN:Mn using metal-organic precursor doping approach
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Kuei-Shen Hsu
(Technische Universität Bergakademie Freiberg, Institute of Applied Physics)
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19:00
Lithium-free segmentable hyperpure germanium detector via Pulsed Laser Melting
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Francesco Sgarbossa
(Dfa unipd)
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19:00
Photo electrical characterization of the interface states in dielectric/AlGaN/GaN structures
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Gabriele Seguini
(CNR-IMM, Unit of Agrate Brianza)
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19:00
Origin and evolution of basal dislocations in HVPE grown GaN
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Ulrich Bläß
(Fraunhofer Institute for Integrated Systems and Device Technology, IISB)
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19:00
Atomic-scale microscopy insights into order and disorder phenomena in AlxGa1-xN
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Enrico Di Russo
(Università di Padova)
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19:00
Identification of the dominant trap states in mixed halide perovskite pellets
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Mahsa Masoud
(Department of Physics and Astronomy, University of Bologna, Viale Berti Pichat 6/2, 40127 Bologna, Italy and Department of Applied Science and Technology (DISAT), Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Turin, Italy)
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19:00
Atomic structures and stability of large-sized vacancy clusters and finite-size extended interstitial defects in silicon: A neural-network potential and first-principles study
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Koji Sueoka
(Okayama Prefectural University)
-
19:00
Deep Level Defects in β-Ga2O3: Insights from Hydrogenation and Oxygen Annealing Studies
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Vladimir Kolkovsky